Work

Characterization of Nanoscale Layers of Heterocomposites Using the Digital Processing of Transmission Electron Microscopy Data

Year: 2025

Type: article

Source: Semiconductors

DOI: 10.1134/s1063782625130020

Authors: R. L. Volkov, G. S. Kireev, O. V. Podorozhniy, A. R. Reshetnyak, A. V. Anikin, N. I. Borgardt

Institution: National Research University of Electronic Technology

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W7123905031

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Cites: 15

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