Work

Reliability test program for submillimeter-wave low-noise amplifiers

Year: 2025

Type: conference-paper

Source: International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

DOI: 10.1109/irmmw-thz61557.2025.11319659

Authors: Mikko Kantanen, Jussi Varis, Mikko Kärkkäinen, Arnulf Leuther, Axel Tessmann, Markus Rösch, Jouni Lätti

Institutions: VTT Technical Research Centre of Finland, Fraunhofer Institute for Applied Solid State Physics, European Space Agency, European Space Research and Technology Centre

Language: English

Topic: Microwave Engineering and Waveguides

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7124139124

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Cites: 3

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