Concurrent In Situ High-Resolution Electron Backscatter Diffraction and Digital Image Correlation for Full-Field Stress-Strain
Year: 2025
Type: article
Source: Microscopy and Microanalysis
DOI: 10.1093/mam/ozaf130
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G855168022
OpenAlex ID: W7124317780
