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Study of the bonding force at the Au-Ag bump/TiW interface in wire bonding

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Year: 2026
Type: article
Source: Soldering and Surface Mount Technology
DOI: 10.1108/ssmt-11-2025-0067
Authors: Bo-Wen Cai, Jia-Qi Wang, Qi Zhang, Li-Yin Gao, Changyou Ren, Zhi-Quan Liu
Institutions: University of Science and Technology of China, Chinese Academy of Sciences, Shenzhen Institutes of Advanced Technology, Southern University of Science and Technology
Language: English

Topic: Electronic Packaging and Soldering Technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed
OpenAlex ID: W7124956292
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Cites: 14
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