Work

Recent upgrades of longitudinal diagnostics at FLASH

Year: 2026

Type: conference-paper

Abstract: In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD[1]), as well as an additional bunch compression monitor (BCM [2]) and a bunch arrival-time monitor (BAM [3]) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP [4]) received a modernized control interface that will allow non-experts to perform bunch profile measurements. The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.

Source: Desy Publications Database (Deutsches Elektronen-Synchrotron DESY)

DOI: 10.18429/jacow-ibic2025-wepco23

Authors: Czwalinna,Marie Kristin, Steffen,Bernd, Roever,Jan, Kral,Jiri

Language: English

Topic: Particle Accelerators and Free-Electron Lasers

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W7124968667

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