Work

Towards Process Optimization by Leveraging Relationships Between Electrical Wafer Sorting and Complete-Line Statistical Process Control Data

Year: 2025

Type: conference-paper

Source: Winter Simulation Conference

DOI: 10.1109/wsc68292.2025.11338957

Authors: Dmitrii Fomin, Anastasiia Doinychko, Andres Torres, Valeria Borodin, David Lemoine, Agnès Roussy, Daniele Pagano, Marco Stefano Scroppo, Gabriele Tochino, Daniele Vinciguerra

Institutions: Centre National de la Recherche Scientifique, Laboratoire des Sciences du Numérique de Nantes, IMT Atlantique, Nantes Université, Mines Saint-Étienne, STMicroelectronics (Italy)

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7125612684

FWCI:

Cites: 16

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