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Integrating AI Agents with Classical Reliability Assessment via LLMs of Semiconductor Lasers

Year: 2025

Type: conference-paper

Source: International Conference on System Reliability and Safety Engineering (SRSE)

DOI: 10.1109/srse67406.2025.11357401

Authors: Chizhi Chris Zhang, Tong Wang, Jian Jiang

Institutions: Chinese Academy of Sciences, Changchun Institute of Optics, Fine Mechanics and Physics, University of Chinese Academy of Sciences

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7125954593

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Cites: 14

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