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Causal Enhancement Learning Framework for Visual Defect Detection of Industrial Components

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Sensing, Diagnostics, Prognostics, and Control (SDPC)

DOI: 10.1109/sdpc68151.2025.11348000

Authors: Zhixian Shi, Zhiwei Xia, Hui Zhou, Mingguang Dai, Xu Ding, Juan Xu

Institution: Hefei University of Technology

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities

OpenAlex ID: W7125987982

FWCI:

Cites: 14

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