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Efficient Few-shot Image Retrieval for Defect Detection in Manufacturing via Meta-Convolutional Networks

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Civil Aviation Safety and Information Technology (ICCASIT)

DOI: 10.1109/iccasit66611.2025.11348928

Authors: Xiaofan Sun, Wei Wang

Institution: Shandong Vocational University of Foreign Affairs

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7126031648

FWCI:

Cites: 13

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