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Implementation of a 1550-nm laser system for beam characterization at the Argonne Wakefield Accelerator

Year: 2026

Type: conference-paper

Abstract: Accurately recording an electron bunch’s longitudinal profile is an important diagnostic for wakefield accelerators employing shaped bunches to increase transformer ratios. Electro-optic sampling of terahertz radiation from the bunch is an attractive approach due to its non-destructive nature. In preparation for future characterization experiments, the Argonne Wakefield Accelerator test facility has recently installed a 1550 nm laser system, including the necessary support systems to synchronize with the photoinjector laser system at 81.25 MHz. We report here on the initial installation and synchronization demonstrations.

Source: JACOW

DOI: 10.18429/jacow-napac2025-mop048

Authors: Ody,Alexander, Piot,Philippe, Whiteford,Charles, Wisniewski,Eric, Wilke,Ingrid, Ruan,Jinhao, Power,John, Rabiei,Payam, Thurman-Keup,Randy, Doran,Scott, Toroghi,Seyfollah, Kellham,Spencer, Scarpine,Victor, Liu,Wanming

Language: English

Topic: Particle Accelerators and Free-Electron Lasers

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

OpenAlex ID: W7126058040

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