Work

Nanoscale Calibration Standards for On-Wafer S-Parameters measurements up to 110 GHz

Year: 2025

Type: article

Source: Springer Link (Chiba Institute of Technology)

DOI: 10.1051/epjconf/202532312003/pdf

Authors: Daouda Seck, Djamel Allal, Florent Marlec, Clément Lenoir, Mohamed Sebbache, Kamel Haddadi

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7127073141

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