Work

Nanometer-resolution hard X-ray near-field ptychography with multilayer Laue lenses

Year: 2025

Type: article

Source: Springer Link (Chiba Institute of Technology)

DOI: 10.1051/epjconf/202533501015/pdf

Authors: Wenhui Zhang, Jan Lukas Dresselhaus, Holger Fleckenstein, Mauro Prasciolu, Margarita Zakharova, Nikolay Ivanov, Chufeng Li, Oleksandr Yefanov, Tang Li, Dmitry Egorov, Ivan De Gennaro Aquino, Philipp Middendorf, Sasa Bajt, Henry Chapman

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7127076960

FWCI:

Cites:

Cited by:

Related to: