Work

Passive Reference Reflectometry for Determining Multilayer Media Levels and Parameters

Year: 2025

Type: article

Source: Instruments and Experimental Techniques

DOI: 10.1134/s0020441225701155

Authors: E. I. Trenkal, A. V. Berestov, V. S. Pozdnyakov, Ia. A. Petenenko

Institution: Tomsk State University of Control Systems and Radio-Electronics

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7127569768

FWCI: 0.228

Cites: 8

Cited by: 1

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