Nanoscale thermal effect induced in situ Cu-based memristor
Year: 2026
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0301433
Authors: Jianxin Lin, Chaoyun Zhang, Tuo Zhang, Shuo Xiang, Songling Xiao, Hao Zhang, Yu Liu, Huachuan Wang, Olcay Kizilaslan, Yicong Huang
Institutions: Harbin Engineering University, Inonu University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G6587547126
OpenAlex ID: W7127576299