Ion optics of a single pair of $$\pm 45^{\circ}$$ angular scanning deflectors for space plasma instruments
Year: 2026
Type: article
Abstract: We have conducted a parameter study on the performance of the ion optics for a $$\pm$$ ± 45° deflection system used in space plasma measurements. The deflection system consists of a pair of electrodes mounted on an electrostatic analyzer. Our numerical model of the ion optics demonstrates its performance, including deflection efficiency for various parameters, and investigates the empirically known upper limit of deflection efficiency. The results reveal that the deflection system essentially involves canceling the kinetic energy perpendicular to the midplane of the deflectors using the electric potential. This implies that the energy of ions capable of $$\pm$$ ± 45° deflection is limited to approximately twice the applied voltage. Based on the insight, an approximate analytical solution has been derived, enabling the prediction of deflection efficiency for deflector shapes represented by power functions. For future development of space plasma analyzers, deflectors can now be designed with theoretical support, similar to the electrostatic analyzers. Graphical Abstract
Source: Earth Planets and Space
Authors: Shoichiro Yokota, Yuki Kitamura, Kentaro Terada, Satoshi Kasahara
Institutions: The University of Osaka, The University of Tokyo
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $1,640
Awards: Evolution of carbon and nitrogen and generation of prebiotic molecules in the Martian atmosphere, Establishment of a foundation for direct observation to realize empirical elucidation of the neutral particle distribution and dynamics of the upper atmosphere of the Earth and planets, Development of mass spectrometers for exploration of interstellar objects, 太陽風照射による二次粒子放出を利用した小型天体表面物質の質量分析
OpenAlex ID: W7127905555