Work

Time‐Varying Reliability Assessment of SPCU Electronics Under Mission Profile Uncertainties

Year: 2026

Type: article

Source: Quality and Reliability Engineering International

DOI: 10.1002/qre.70176

Authors: Ying Zeng, Tudi Huang, Jing Li, Hong‐Zhong Huang

Institutions: University of Electronic Science and Technology of China, China University of Petroleum, Beijing

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G1849386939

OpenAlex ID: W7127951805

FWCI:

Cites: 32

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