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A Comprehensive Analysis of STT-MRAM-based Bayesian Neural Network Implementation

Year: 2025

Type: article

Source: Journal of the Institute of Electronics and Information Engineers

DOI: 10.5573/ieie.2025.62.12.46

Authors: Dasom Ahn, Siyeal Lee, Taehui Na

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7128030076

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