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Automated Label Structure Validation for Multi-source Iris Detection Datasets

Year: 2025

Type: article

Source: Journal of the Institute of Electronics and Information Engineers

DOI: 10.5573/ieie.2025.62.12.106

Authors: Seung-Jin Kim, Myuhng-Joo Kim

Language: English

Topic: Advanced Neural Network Applications

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7128076119

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