Work

Near-sensor testing method for observing radiation-induced soft errors in modern sensors

Year: 2025

Type: conference-paper

Source: HAL (Le Centre pour la Communication Scientifique Directe)

Authors: Minelli de Carvalho, Matheus, Cheymol, Benjamin, Naviner, Lirida, Possamai Bastos, Rodrigo

Institutions: Laboratoire de Physique Subatomique et de Cosmologie, Télécom Paris, Institut Polytechnique de Paris

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7128142945

FWCI:

Cites:

Cited by:

Related to: