Work

In‐Operando 4D‐STEM and STEM‐EBIC Imaging of Electric Fields and Charge Carrier Behavior in Biased Silicon p–n Junctions

Year: 2026

Type: article

Abstract: ABSTRACT Electronic devices are shrinking, and scanning transmission electron microscopy is essential for the characterization of in‐operando nanoscale devices. This paper demonstrates the combined capabilities of 4D‐STEM and STEM‐EBIC for measuring localized electronic properties (electric field strength, field direction, built‐in potential, and minority carrier diffusion length) in an in‐operando nanoscale device. Quantitative analysis supported by simulations enables robust interpretation of local electric fields and potential gradients. STEM‐EBIC measurements at different thicknesses show a regime where the effective diffusion length of minority carriers is entirely dominated by surface recombination. In situ biasing of a symmetrically doped 4 × 10 17 cm −3 p–n diode shows how 4D‐STEM and STEM‐EBIC complement each other for localized interpretation of electronic components.

Source: Advanced Electronic Materials

DOI: 10.1002/aelm.202500415

Authors: Eoin Moynihan, Yining Xie, David Cooper, Grigore Moldovan, Richard Beanland, Ana Sanchez

Institutions: University of Warwick, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Laboratoire d'Électronique des Technologies de l'Information, Université Grenoble Alpes

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: gold

Estimated APC paid: $3,560

Funders: UK Research and Innovation, University of Warwick, Engineering and Physical Sciences Research Council