Year: 2026
Type: article
Abstract: Energy-Dispersive X-ray Diffraction (EDXRD) employs a polychromatic (white) X-ray beam and an energy-discriminating detector at a fixed scattering geometry to measure diffracted intensity as a function of photon energy. This technique enables the rapid acquisition of diffraction data over a wide range of d-spacings without mechanical scanning of the scattering angle, making it particularly valuable for time-resolved, bulk-penetrating, and operando studies. In this review, we provide a comprehensive overview of EDXRD, covering the fundamental principles and underlying physics, experimental methodologies and data analysis workflows, synchrotron white-beam implementations compared to monochromatic approaches, detector strategies, parameter optimization for accurate and efficient measurements, and representative applications in high-pressure science and battery research. Finally, we discuss current challenges and future prospects, including advances in detector technology, machine learning-assisted spectral analysis, and the development of standardized, automated EDXRD systems.
Source: Materials
DOI: 10.3390/ma19040697
Institutions: Chinese Academy of Sciences, Institute of High Energy Physics
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $3,137
OpenAlex ID: W7128680486