Engineering Dielectric Genes in Debye Relaxation Model toward Frequency‐Band‐Reliant Electromagnetic Responses
Year: 2026
Type: article
Source: Advanced Materials
Authors: Junye Cheng, Qingkui Chen, Honghan Wang, Yongheng Jin, Shan Jiang, Bailing Xie, Yifan Wang, Haoming Zheng, Bin Liu, Chao Wu, Guangping Zheng, Renchao Che
Institutions: Shenzhen MSU-BIT University, Beijing Institute of Technology, Zhejiang University of Science and Technology, Northwestern Polytechnical University, State Key Laboratory of Chemical Resource Engineering, Beijing University of Chemical Technology, China Construction Eighth Engineering Division (China), Hong Kong Polytechnic University, Fudan University
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7128716046
