Work

Bayes Analysis of One-Shot Device Testing Data with Dependence Structure Using Copula Models and the Exponential Marginals

Year: 2026

Type: article

Source: International Journal of Reliability Quality and Safety Engineering

DOI: 10.1142/s0218539326500087

Authors: Ashkamini, Reema Sharma, Satyanshu K. Upadhyay

Institutions: Birla Institute of Technology, Mesra, Banaras Hindu University

Language: English

Topic: Statistical Distribution Estimation and Applications

Subfield: Statistics and Probability

Field: Mathematics

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7128735585

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