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Embedded PCB and DBC-integrated design of 650 V GaN power modules with enhanced thermal and electrical performance

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Year: 2026
Type: article
Source: Microelectronics Reliability
DOI: 10.1016/j.microrel.2026.116053
Authors: A. Yeong Choi, Jaejin Jeon, Jae Hyuk Lim, Sang Won Yoon
Institutions: Seoul National University, Samsung (South Korea), Samsung Electronics (South Korea)
Language: English

Topic: Silicon Carbide Semiconductor Technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: Ministry of Trade, Industry and Energy, National Research Foundation of Korea, Ministry of Science and ICT, South Korea, Samsung, Korea Evaluation Institute of Industrial Technology
Awards: G7438821695, G7544679996, G933621119
OpenAlex ID: W7128780223
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Cites: 24
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