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Alcohol-Dependent CuI Iodization Kinetics toward In Situ Repairable and Fault-Tolerant RRAM Switching

Year: 2026

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.5c22493

Authors: Geun Lee, Dhananjay Mishra, Nagaraju Mukurala, Hyeon Bin Jo, Han Min Kim, Yoon Sung Lee, Sung Hun Jin

Institutions: Incheon National University, Kyung Hee University, Korea University

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Ministry of Trade, Industry and Energy, National Research Foundation of Korea

Awards: G792275204, G8284770503

OpenAlex ID: W7129094908

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Cites: 73

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