Work

In Situ Transmission Electron Microscopy Visualization of Electric-Field-Induced Phase Transitions at the Morphotropic Phase Boundary in Hf 0.5 Zr 0.5 O 2

Year: 2026

Type: article

Source: ACS Nano

DOI: 10.1021/acsnano.5c15856

Authors: Sanghyo Lee, Sanghyo Lee, Sojin Kim, Jinseok Ryu, Jaewook Lee, Jinseok Hong, Ji Eun Kim, Ju-Young Cha, Yunho Shin, Daewoong Kwon, Jung Ho Yoon, Min Hyuk Park, Miyoung Kim, Seung-Yong Lee, Seung-Yong Lee

Institutions: Seoul National University, Hanyang University, Diamond Light Source, Korea University, Korean Association Of Science and Technology Studies, Korea Institute of Science and Technology, Sungkyunkwan University

Language: English

Topic: Ferroelectric and Negative Capacitance Devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Korea Basic Science Institute, National Research Foundation of Korea, Samsung

Awards: G173215764, G3251434144, G6082596627, G8299433672, G8428375417, G961282906

OpenAlex ID: W7130322087

FWCI: 5.056

Cites: 34

Cited by: 3

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