Work

Two-axis goniometer facility for x-ray characterization of diffractors

Year: 2026

Type: article

Abstract: A detailed description of a two-axis goniometer paired with an x-ray source is provided, encompassing measurements of double-crystal integrated reflectivity for diffractors employed in JET spectrometers. Polarization adjustments to these measurements are computed to estimate single-crystal integrated reflectivity. Synchronized parallel and dispersive diffractor motion profiles at this facility exhibit favorable angular error distributions, engaging all motors with deviations of ∼2 arcsec across the full range of accessible Bragg angles (0°-86°).

Source: Review of Scientific Instruments

DOI: 10.1063/5.0281612

Author: A. M. Patel

Institution: United Kingdom Atomic Energy Authority

Language: English

Topic: Crystallography and Radiation Phenomena

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: hybrid

Funder: Engineering and Physical Sciences Research Council

Award: UKAEA / EPSRC Fusion Grant 2022/27