Towards On-Machine Surface Metrology Using Image-Based Frequency Analysis for Surface Variation Analysis
Year: 2026
Type: article
Abstract: Machined surfaces contain rich information about machining conditions and system behavior and are typically assessed using off-line, small-area metrology. This study developed and validated an image-based methodology for process-oriented surface texture analysis of end-milled Spheroidal Graphite Iron (SGI), enabling scalable, non-contact monitoring suitable for in-line deployment. End milling trials were conducted under optimized and aggressive cutting conditions and in two orthogonal feed directions (X,Y). Surface topography from White Light Interferometry (WLI) was complemented by Charge-Coupled Device (CCD) microscope imaging. Image processing comprised automatic orientation correction, intensity profile extraction, and frequency-domain analysis via Fast Fourier Transform and power spectral density estimation. Texture metrics (RMS amplitude, skewness, kurtosis, dominant wavelength) were derived from intensity profiles, and two spectral indices were introduced: a Change Index (CI), capturing high-frequency content linked to process disturbances, and a Surface Anisotropy Metric (SAM), quantifying texture directionality. Aggressive cutting increased RMS by 28.5% and shifted skewness by 274% with strong statistical significance. Directional analysis showed 22% higher texture amplitude in Y than X, indicating axis-dependent machine behavior. CI correlated with the machining parameters and stability, while SAM reflected the machine and setup characteristics. Trends were consistent with WLI, supporting the method as a rapid, complementary tool for surface quality and machine condition monitoring.
DOI: 10.3390/jmmp10020069
Language: English
Subfield: Mechanical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,172
OpenAlex ID: W7130333833