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Test-time Verification via Optimal Transport: Coverage, ROC, & Sub-optimality
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Year:
2026
Type:
conference-paper
Abstract:
International audience
Source:
HAL (Le Centre pour la Communication Scientifique Directe)
Authors:
Mukherjee, Arpan,
Bullo, Marcello,
Basu, Debabrota,
Gündüz, Deniz
Institutions:
Imperial College London,
Université de Lille,
Centre Inria de l'Université de Lille,
Centre de Recherche en Informatique, Signal et Automatique de Lille,
SCOOL: Prise de décision séquentielle dans l'incertain,
Centrale Lille Institut
show all 6
Language:
English
Topic:
Software Testing and Debugging Techniques
Subfield:
Software
Field:
Computer Science
Domain:
Physical Sciences
Open Access status:
green
OpenAlex ID:
W7130776382
FWCI:
Cites:
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