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Test-time Verification via Optimal Transport: Coverage, ROC, & Sub-optimality

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Year: 2026
Type: conference-paper
Abstract: International audience
Source: HAL (Le Centre pour la Communication Scientifique Directe)
Authors: Mukherjee, Arpan, Bullo, Marcello, Basu, Debabrota, Gündüz, Deniz
Institutions: Imperial College London, Université de Lille, Centre Inria de l'Université de Lille, Centre de Recherche en Informatique, Signal et Automatique de Lille, SCOOL: Prise de décision séquentielle dans l'incertain, Centrale Lille Institut
Language: English

Topic: Software Testing and Debugging Techniques
Subfield: Software
Field: Computer Science
Domain: Physical Sciences

Open Access status: green
OpenAlex ID: W7130776382
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