Work

AFM-IR Characterization of Nano-Fabricated Multilayer Pillars for Advanced Nanoscale Sensing

Year: 2025

Type: conference-paper

Source: British and Irish Conference on Optics and Photonics (BICOP)

DOI: 10.1364/bicop.2025.th5b.4

Authors: Yide Zhang, Ufuk Yilmaz, Artem S. Vorobev, Simone Iadanza, Liam O’Faolain, Bernhard Lendl, Georg Ramer

Institutions: TU Wien, Munster Technological University, Tyndall National Institute, Paul Scherrer Institute

Language: English

Topic: Near-Field Optical Microscopy

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7131311225

FWCI:

Cites: 4

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Related to: 10