From Design of Experiments to Neural Network Models for Predicting Sintered Nanosilver Joints Degradation Under Thermal Shocks
Year: 2026
Type: article
Source: Journal of Electronic Packaging
DOI: 10.1115/1.4071220
Authors: Lahouari Benabou, Laurent Vivet
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7131616645
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