Effects of Oblique Incidence in Pixel Detectors on Diffraction Experiments
Year: 2024
Type: article
Source: European XFEL
Authors: Ruter T., Hauf, Steffen, Kuster, Markus, Struder L.
Language: English
Subfield: Nuclear and High Energy Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7132108572
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