Work

Electrical Characterization of Transition-metal dichalcogenides using Scanning Microwave Impedance Microscopy (sMIM)

Year: 2025

Type: conference-paper

Source: ORBi UMONS

Authors: Aparecido Ferreira, Alex, Tardiolle, Allan, Barbieri Estefani, Renan, Brites Queiroz Martins de Oliveira, Camilla Karla, Nickmilder, Pierre, Leclère, Philippe

Institutions: Universidade Federal do Paraná, University of Mons

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7133433461

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