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An Integrated Deep Learning Framework for Trading Card Grading: Design, Deployment, and Evaluation

Year: 2025

Type: conference-paper

Source: IEEE International Conference on Big Data (BigData)

DOI: 10.1109/bigdata66926.2025.11401677

Authors: Lutfun Nahar, Md. Saiful Islam, Mohammad Awrangjeb, Rob Verhoeve

Institutions: Griffith University, University of Newcastle Australia

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7134199378

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Cites: 20

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