Toward Real-Time Industrial Small Object Inspection: Decoupled Attention and Multi-Scale Aggregation for PCB Defect Detection
Year: 2026
Type: article
Abstract: PCB surface defect detection plays a critical role in ensuring electronics manufacturing quality. To address the challenges of small target defect detection, this study proposes PCB-YOLO, an enhanced lightweight detector based on YOLOv8n. PCB-YOLO introduces three key improvements. First, a RepViT-EMA Fusion Architecture (REFA) module is designed for deep backbone layers to strengthen feature extraction while suppressing background interference from complex circuit patterns. Second, a Multi-Scale Grouped Aggregation (MSGA) module is developed to reduce feature redundancy and improve spatial-semantic information extraction for multi-scale defects. Third, a Pixel-level Intersection over Union (PIoU) loss function is proposed to enable pixel-level IoU calculation with enhanced angular and area constraints for more precise localization. Extensive experiments on the PKU-Market-PCB dataset demonstrate that PCB-YOLO achieves 98.4% [email protected], 97.4% recall, and 96.1% precision with only 2.4 M parameters, 6.9 G FLOPs, and an inference speed of 224 FPS, outperforming multiple state-of-the-art methods while maintaining real-time capability. Additional experiments on the DeepPCB dataset yield 99.0% [email protected] and 80.4% [email protected]:0.95, confirming the cross-dataset generalization ability of the proposed method.
Source: Electronics
Authors: Yuting Wang, Bingyang Guo, Liming Sun, Ruiyun Yu
Institution: Northeastern University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,896
OpenAlex ID: W7135024482