Stability and isolation of uranium carbide phases in thin film systems
Year: 2026
Type: article
Abstract: Polycrystalline uranium carbide (UC x ) and epitaxial single crystal uranium monocarbide (UC) thin films have been synthesised using DC magnetron sputtering. By correlating X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) measurements, it was revealed that UC x surfaces maintained a NaCl-type cubic structure whilst exhibiting a range of UC stoichiometries. Epitaxial [001]-oriented UC was isolated and stabilised upon the [001] ∥ [1 1 ̄ 02] Nb/Al 2 O 3 system, with in- and out-of-plane lattice parameters of a ( 024 ) = 4.9875(5) Å and a ( 002 ) = 4.96546(7) Å, respectively. Through XPS area analysis of the U- 4 f and C- 1 s core levels, this sample was found to be stoichiometric within experimental uncertainty. This methodology presents a route to explore the physical structure and fundamental chemical properties of individual carbide phases.
Source: Thin Solid Films
Authors: L.M. Harding, J. Gregson, C. Kinross, J. Laverock, D.T. Goddard, C. Bell, R. Springell
Institutions: University of Bristol, National Nuclear Laboratory
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $3,120
OpenAlex ID: W7135370699