Work

Epitaxial Growth of p ‐Type β ‐Ga 2 O 3 Thin Films and Demonstration of a p–n Diode

Year: 2026
Type: article
Abstract: ABSTRACT β ‐Ga 2 O 3 , with its ultrawide bandgap (∼4.9 eV) and well‐established n‐type conductivity, is a promising semiconductor for next‐generation power electronics. However, the realization of stable p ‐type doping remains a fundamental challenge owing to the deep‐acceptor levels of conventional dopants. Here, a Te–Mg co‐doping strategy is developed via metal–organic chemical vapor deposition (MOCVD) to overcome this limitation. The co‐doped films exhibit a room‐temperature resistivity of 32.4 Ω·cm, a Hall hole concentration of 1.78 × 10 1 7 cm − 3 , and mobilities up to 5.29 cm 2 V − 1 s − 1 at lower carrier concentrations (5.72 × 10 14 cm − 3 ). A preliminary p–n diode is successfully demonstrated. Density functional theory (DFT) calculations reveal that Te incorporation introduces an intermediate band near the valence band maximum (VBM), effectively reducing the Mg acceptor ionization energy. Spectroscopic analyses further confirm VBM elevation through Te–Ga orbital hybridization and a Fermi‐level shift toward the valence band, consistent with p‐type behavior. These results establish a viable route for achieving p ‐type β ‐Ga 2 O 3 homoepitaxy and lay the groundwork for future optimization toward sub‐1 Ω·cm resistivity and a deeper understanding of the Te–Mg doping mechanism, paving the way for bipolar device applications in ultrawide‐bandgap electronics.
Language: English
Open Access status: gold
Estimated APC paid: $3,560
OpenAlex ID: W7135392374
FWCI: 3.952
Cites: 30
Cited by: 4
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