Work

Gate health state assessment of SiC MOSFET based on clustering algorithm and 2D-cloud modeling

Year: 2026

Type: article

Source: Circuit World

DOI: 10.1108/cw-01-2026-0003

Authors: Chenhao Tang, Pengju Sun, Junke Wu, Chun He

Institutions: Chongqing University, Guilin University of Electronic Technology

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G3720819286

OpenAlex ID: W7138167102

FWCI: 1.766

Cites: 20

Cited by: 1

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