Work

In Situ Monitoring of Diffusive Morphology Transformation of Semiconductor Materials under Joule Heating

Year: 2026

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.5c25601

Authors: Taeyeong Kim, Bong Jae Lee, Jungchul Lee

Institution: Korea Advanced Institute of Science and Technology

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: National Research Foundation of Korea, Ministry of Science and ICT, South Korea

Awards: G226627379, G389667205, G7950294668, G8986642837

OpenAlex ID: W7140072763

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Cites: 64

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