Investigation of the Effect of the Randomness Criterion on the Success of Passing NIST Tests by a Quantum Random Number Generator
Year: 2025
Type: article
Source: Russian Microelectronics
Authors: D. Mavkov, M. Sibgatullin, L. Gilyazov, N. Arslanov
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7140105763
