Work

Physics-Based Modeling of the Single Event Upset Critical Charge in Digital Electronics

Year: 2025

Type: article

Source: Russian Microelectronics

DOI: 10.1134/s1063739725601468

Authors: A. A. Mateiko, A. S. Rodin, I. A. Makarova, E. N. Abramova, G. I. Zebrev

Institution: National Research Nuclear University MEPhI

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7140117611

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Cites: 8

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