Work

Beyond a single mechanism: Uncovering the dual origin of degradation in β -Ga2O3 SBDs under forward bias stress

Year: 2026

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0309118

Authors: Yingzhe Wang, Xuefeng Zheng, Sijie Bu, Tan Wang, Kang Li, Man Hoi Wong, Lixin Guo, Xiaohua Ma, Yue Hao

Institutions: Xidian University, Hong Kong University of Science and Technology

Language: English

Topic: Ga2O3 and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Basic Research Program of Shaanxi Province

Awards: G1481553644, G2408798713, G6167179484, G7014882925, G7578523845

OpenAlex ID: W7140160067

FWCI: 1.028

Cites: 28

Cited by: 1

Related to: