Work

Study of leakage current in GaN junction field-effect transistor under heavy ion radiation

Year: 2026

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0313387

Authors: Jianan Song, Zequan Chen, Yuxin Du, Yixin Xiong, Rongming Chu, Miaomiao Jin

Institutions: Pennsylvania State University, University of Illinois Urbana-Champaign, University of Illinois System

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Air Force Office of Scientific Research

Award: G2156497905

OpenAlex ID: W7140689685

FWCI:

Cites: 16

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