Work

Millisecond-order X-ray phase tomography with a fringe-scanning method

Year: 2018

Type: article

Abstract: We successfully realized millisecond-order X-ray phase tomography using a fringe-scanning method in grating-based X-ray interferometry. We obtained phase tomograms with a measurement time of 4.43 ms using a white synchrotron X-ray beam. The use of a fringe-scanning method enables us to achieve not only a higher spatial resolution but also a higher signal-to-noise ratio than that attained by the Fourier transform method. In addition, our approach can be applied to realize four-dimensional or high-throughput X-ray tomography for samples that can be rotated at a high speed.

Source: Applied Physics Express

DOI: 10.7567/apex.11.122501

Authors: Wataru Yashiro, Chika Kamezawa, Daiji Noda, Kentaro Kajiwara

Institutions: Tohoku University, Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, The Graduate University for Advanced Studies, SOKENDAI, Micromachine Center, Japan Synchrotron Radiation Research Institute

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

Funders: Japan Society for the Promotion of Science, Japan Science and Technology Agency, Core Research for Evolutional Science and Technology

Awards: G1674234069, 超圧縮センシングによるミリ秒X線トモグラフィ法の開発, Development of super-high-sensitivity multimodal X-ray imaging, High-speed and high-sensitive X-ray imaging and tomography with millisecond-order tempol resolution, Development of high-spatial-resolution and high-sensitivity X-ray detector using high-aspect-ratio structured scintillator