Work

Scale correction in submicron computed tomography with a submillimeter field of view

Year: 2025

Type: article

Source: Tomography of Materials and Structures

DOI: 10.18154/rwth-2026-03786

Authors: Zemek, Marek, Blažek, Pavel, Šalplachta, Jakub, Zikmund, Tomáš, Petřík, Michal, Schmitt, Robert H., Kaiser, Jozef

Institution: RWTH Aachen University

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W7147286999

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