Year: 2026
Type: article
Abstract: Superconducting qubits show great promise for the realization of fault-tolerant quantum computing, but lossy, amorphous dielectrics limit current technology. Identifying highly crystalline and stoichiometric dielectrics with intrinsically low microwave loss is therefore a central materials challenge, yet experimentally validated platforms remain scarce. This work integrates a crystalline dielectric into a heteroepitaxial TiN/γ-Al2O3/TiN trilayer grown via pulsed laser deposition. Correlative high-resolution imaging, diffraction, and spectroscopy measurements confirm the single-crystal quality and chemical integrity of all layers, with minimal defects and limited anion interdiffusion across the oxide–nitride interfaces. Using microwave lumped-element resonators with parallel-plate capacitors, this work establishes an experimentally measured upper bound for the dielectric loss of epitaxial γ-Al2O3, which has a low intrinsic two-level system loss of δTLS0 = (2.8 ± 0.1) × 10–5. These results establish heteroepitaxial oxides on transition metal nitrides as an attractive materials platform for superconducting quantum circuits, particularly for integration into compact device architectures such as merged-element transmons and microwave kinetic inductance detectors.
Source: ACS Nano
Language: English
Subfield: Artificial Intelligence
Field: Computer Science
Domain: Physical Sciences
Open Access status: green
Funders: National Science Foundation, U.S. Department of Energy, Northwestern University, University of Chicago, National Institutes of Health, Office of Science, Materials Research Science and Engineering Center, Harvard University, Division of Materials Research, Division of Electrical, Communications and Cyber Systems, High Energy Physics, Center for Hierarchical Materials Design, Fermilab
Awards: NNCI: Soft Hybrid Nanotechnology Experimental (SHyNE) Resource, G2233802770, G2343375527, G3010471893, G3203750490, Northwestern University Materials Research Science and Engineering Center, Acquisition of a K2 Camera for Soft Matter Transmission Electron Microscopy, G4958141111, G5574724152, G6471802762, G6540817556
OpenAlex ID: W7147387927
