Recent advances in X-ray microscopy instrumentation developments at NSLS-II
Year: 2026
Type: conference-paper
Abstract: X-ray microscopy is a mature characterization tool routinely used to investigate diverse material questions of science, technology, and engineering. The high penetration power of X-rays allows the utilization of different characterization methods and reveals elemental composition, crystalline phases, strain distribution, oxidation states, etc. in macroscopic and microscopic samples. Full-field and scanning X-ray microscopes serve similar scientific purposes but prvoide technical capabilities that complement each other. In recent years, a number of X-ray microscopy systems have been designed, constructed, and commissioned at NSLS-II. During the presentation, we will provide a technical overview of recently designed microscopy instruments. It will include the design details of the Multilayer Laue Lens-based nanoprobe optimized for ~10 nm spatial resolution imaging, its current status, and future upgrades$*$,$**$ ; the zoneplate-based full-field imaging system capable of 1-minute nano-tomography measurements$***$ ; and a new Kirkpatrick-Baez based scanning microscope designed for ~200 nm spatial resolution experiments $****$.
Source: JACOW
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W7148468480
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