Strain Metrology of GaN/AlN Heterostructures and Devices
Year: 2026
Type: dissertation
Abstract: 112 pages
Source: eCommons (Cornell University)
DOI: 10.7298/w6x7-sj76
Author: Veeraraghavan, Nikilesh
Institution: Cornell University
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7148546209
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