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Enhancement of etch rate and selectivity for tungsten carbide hardmask

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Year: 2026
Type: article
Source: Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
DOI: 10.1116/6.0005300
Authors: Wan Soo Song, Beom Seok Kim, Aram Kim, Sang Jeen Hong
Institutions: Myongji University, Hanyang University
Language: English

Topic: Plasma Diagnostics and Applications
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funder: Korea Evaluation Institute of Industrial Technology
Award: G7283542360
OpenAlex ID: W7148718960
FWCI:
Cites: 27
Cited by:
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