Cryogenic Electron Microscopy Approaches to Nanoscale Characterization of Beam-Sensitive Materials
Year: 2026
Type: dissertation
Abstract: 166 pages
Source: eCommons (Cornell University)
DOI: 10.7298/4mwm-jf44
Author: Colletta, Michael
Institution: Cornell University
Language: English
Subfield: Structural Biology
Domain: Life Sciences
Open Access status: green
OpenAlex ID: W7148810968
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